- Model: P-10 - Up to 8"/200mm Wafer Capable - Microhead I - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan. - Built-in PC computing power - DOS-based software control and data analysis. - Measurement of vertical features ranging from under 100Å (0.4 min.) to approximately 300 µm (11 mils), with a vertical resolution of 0.5, 2, or 10Å. - A virtually unlimited number of data points per profile guarantee that the horizontal resolution is limited by the stylus radius and not by the number of data points. - Measurement of many roughness and waviness parameters, with user-selectable cutoff filters to isolate roughness and waviness. - Ability to fit and level a scan, allowing accurate step height measurements on curved surfaces. - Ability to detect the edge or apex of a profile feature, allowing automated data analysis relative to the feature. - The KLA P-10 to repeat a scan up to ten times and automatically calculate the average, thereby minimizing the effects of environmental noise on measurements. - Refurbished to Meet Original KLA-Tencor P-10 Specifications - Available for Full Inspection and Demonstration!